Private AI for semiconductors & electronics.

Trace a defect back through the production evidence

A yield change may be linked to a process step, test condition or inspection pattern.

KOVA can be configured to work with these inputs: authorised inspection images, wafer or board identifiers, test results and process metadata.

What the AI looks for

Group defects, detect shifts and correlate failure patterns with recorded manufacturing conditions.

What happens next

Create an engineering review package and track investigation actions by lot or design revision.

What SOS AI connects and configures

Inspection-system and test-data interfaces, labelled examples and revision-aware storage.

KOVA runs the selected models locally. SOS AI combines the required model software, data connections and approved application tools around the job. Cameras, sensors, telephony and specialist applications are integrated where the workflow calls for them; they are not assumed to be present in every installation.

How to judge the result

Validate detection on unseen lots; process changes and release remain engineering decisions.